Document › Details

Agilent Technologies Inc.. (2/5/10). "Press Release: Agilent Technologies’ Scanning Microwave Microscopy Garners Second Major Innovation Award". Santa Clara, CA.

Organisation Organisation Agilent Technologies Inc. (NYSE: A)
  Group Agilent (Group)
Products Product SMM Mode (scanning microwave microscopy mode)
  Product 2 Agilent 5420 AFM (atomic force microscope)
Index term Index term award (company/product/person – research/business)
     
Agilent Technologies Inc. (NYSE: A) today announced that its Scanning Microwave Microscopy Mode (SMM Mode) has been named one of 10 2009 Prism Award winners by judges from SPIE and the advisory board of Laurin Publishing's Photonics Spectra magazine.

SMM Mode was officially recognized for outstanding photonics innovation in the category of "Analytical, Test, and Measurement" at a special ceremony during SPIE Photonics West. SMM Mode previously was named an R&D 100 Award winner by an independent judging panel and the editors of R&D Magazine. Agilent developed SMM Mode to enable high-resolution, quantitative electromagnetic materials characterization using the company's popular 5420 and 5600LS atomic force microscopes.

"We are honored to receive both the R&D 100 and Prism Awards for SMM Mode," said Jeff Jones, operations manager for Agilent's nanoinstrumentation facility in Chandler, Ariz. "By combining the calibrated electrical measurement capabilities of a microwave vector network analyzer with the nanoscale spatial resolution of an atomic force microscope (AFM), this unique technology not only offers a leading-edge tool for the evaluation of semiconductor materials, but also for applications in biological and materials research."

Data from representative samples demonstrate that Agilent SMM Mode is capable of mapping material properties at a resolution ultimately limited by the sharpness of the AFM probe. Robust electromagnetic environment compatibility elements, and built-in precision electronic components, allow SMM Mode to provide calibrated, and more sensitive measurements than those attainable with previously available AFM-based electrical characterization techniques.

Agilent SMM Mode can be used on semiconductors (no oxide-layer required), metals, dielectric materials, ferroelectric materials, insulators and biological materials. SMM Mode measures properties associated with small variations in the electromagnetic interactions of a sample's different components with the incident microwave signal, either statically or dynamically.

AFM Instrumentation from Agilent Technologies

Agilent Technologies offers high-precision, modular AFM solutions for research, industry and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent's leading-edge R&D laboratories ensure the continued, timely introduction and optimization of innovative, easy-to-use, AFM technologies.

About Agilent Technologies

Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in communications, electronics, life sciences, and chemical analysis. The company's 17,000 employees serve customers in more than 110 countries. Agilent had net revenues of $4.5 billion in fiscal 2009. Information about Agilent is available on the Web at www.agilent.com.

# # #

Contact:

Janet Smith, Americas
+1 970 679 5397
janet_smith@agilent.com

Joan Horwitz, Americas
+1 480 756 5905
joan_horwitz@agilent.com

Sarah Calnan, Europe
+44 (118) 927 5101
sarah_calnan@agilent.com

Iris Ng, Asia
+852 31977979
iris-hw_ng@agilent.com

   
Record changed: 2010-07-21

More documents for Agilent (Group)

To get even more information, please take a look at our [gs] professional services offering and read the gene-sensor Product Flyer [PDF file]
» top